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Titre	Semiconductor Material and Device Characterization
Nom de fichier	semiconductor-materi_6qvO0.epub
	semiconductor-materi_992Ky.aac
Une longueur de temps	46 min 19 seconds
Lancé	3 years 9 months 1 day ago
Des pages	250 Pages
Classe	FLAC 44.1 kHz
Taille	1,197 KiloByte

Semiconductor Material and Device Characterization

Catégorie: Actu, Politique et Société, Érotisme
Auteur: Ralph Ellison
Éditeur: G. Edward Griffin, Alison Smith
Publié: 2018-02-11
Écrivain: Neil Strauss
Langue: Hongrois, Chinois, Hindi, Tagalog
Format: epub, pdf

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Schroder Semiconductor Material and Device - 3rd edition. Wiley-Interscience, 2006. - xv, 781 p. Resistivity Carrier and Doping Density Contact Resistance and Surface Barriers Series Resistance, Channel Length and Width, and Threshold Voltage Defects Oxide and Interface Trapped

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Semiconductor material and device characterization : - Xv, 599 p. : 25 cm. "A Wiley-Interscience publication.". Includes bibliographical references and index

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Semiconductor Material and Device Characterization - PDF - Semiconductor characterization has continued its relentless advance since the publication of the second edition. New techniques have been developed, others have been refined. The resistivity ρ of a semiconductor is important for starting material as well as for semiconductor devices

Semiconductor material and device characterization | PVEducation - Semiconductor material and device characterization. Submitted by drupal on Sat, 04/28/2012 - 22:47. D. Schroder, Semiconductor material and device characterization, 3rd editionrd ed. Piscataway NJ; Hoboken IEEE Press; Wiley, 2006

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